High-speed, stationary sample microtomography of large samples
High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples