High-resolution benchtop microtomography of large samples
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software