Our most popular diffractometer for Chemical Crystallography and Mineralogy, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
300 kV microcomputerized directional industrial X-ray system