Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator
250 kV microcomputerized directional industrial X-ray system
Ultra-high resolution nanotomography using parallel beam geometry