New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
Scanning multi-element process coatings analyzers for web or coil applications
Process sulfur analysis by X-ray transmission (X-ray absorption)
High-resolution benchtop microtomography of large samples
high energy resolution pixel detector capable of 0, 1, and 2D measurements
Ultra-high resolution nanotomography using parallel beam geometry