High-resolution benchtop microtomography of large samples
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer