High-resolution benchtop microtomography of large samples
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Ultra-high resolution nanotomography using parallel beam geometry
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
EDXRF spectrometer with powerful Windows® software and optional FP.