High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator
250 kV microcomputerized directional industrial X-ray system
Ultra-high resolution nanotomography using parallel beam geometry
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)