Orientation analysis of an organic thin film on a rubbed glass substrate by In-Plane XRD AppNote XRD2005: Orientation analysis of an organic thin film on a rubbed glass substrate by In-Plane XRD
Examination for growth process of an organic thin film by In-Plane XRD AppNote XRD2007: Examination for growth process of an organic thin film by In-Plane XRD
Orientation analysis of an organic thin film on a single crystal substrate by In-Plane XRD AppNote XRD2009: Orientation analysis of an organic thin film on a single crystal substrate by In-Plane XRD
Phase identification and orientation analysis for thin film SOFC material using a 2D detector AppNote XRD2020: Phase identification and orientation analysis for thin film SOFC material using a 2D detector
High speed RSM of an epitaxial film by 1D detection mode AppNote XRD2021: High speed RSM of an epitaxial film by 1D detection mode
Observation of butter crystal by simultaneous XRD-DSC measurement AppNote XRD1135 - Butter crystal by XRD-DSC
Background reduction of diffraction profiles for iron oxide with CuKα X-rays using the detector’s XRF mode on a benchtop X-ray diffractometer AppNote XRD1127: Background reduction of diffraction profiles for iron oxide with CuKα X-rays using the detector’s XRF mode on a benchtop X-ray diffractometer
Structural characterization of zeolite by PDF analysis AppNote XRD1131: Structural characterization of zeolite by PDF analysis