High-resolution benchtop microtomography of large samples
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
200 kV microcomputerized directional industrial X-ray system
300 kV microcomputerized directional industrial X-ray system