New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging