High-resolution X-ray detectors for X-ray diffractometers from DECTRIS.
User-inspired data collection and data processing software for small molecule and protein crystallography.
Automated crystal transport, orientation and retrieval robot specifically designed for high-throughput structural biology.
In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers
Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples
Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers
Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.