High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software