Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
A benchtop single crystal X-ray diffractometer ideal for chemical crystallography and teaching.
High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry