2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-resolution benchtop microtomography of large samples
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Ultra-high resolution nanotomography using parallel beam geometry
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
A cost-effective solution for departments looking for targeted chemical threat analysis