High-resolution benchtop microtomography of large samples
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer