High-resolution benchtop microtomography of large samples
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
Our most popular diffractometer for Chemical Crystallography and Mineralogy, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.