High-resolution benchtop microtomography of large samples
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
A benchtop single crystal X-ray diffractometer ideal for chemical crystallography and teaching.
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
300 kV microcomputerized directional industrial X-ray system