The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
High-resolution benchtop microtomography of large samples
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
Ultra-high resolution nanotomography using parallel beam geometry