Quantitative characterization of polymer film using orientation function AppNote XRD1119: Quantitative characterization of polymer film using orientation function
High speed RSM of a III-nitride epitaxial film by 1D detection mode AppNote XRD2024: High speed RSM of a III-nitride epitaxial film by 1D detection mode
Rietveld quantitative analysis of trace components in cement using a benchtop X-ray diffractometer AppNote XRD1076: Rietveld quantitative analysis of trace components in cement using a benchtop X-ray diffractometer
Quantitative analysis of amorphous components in cement by combining the RIR method and the Rietveld method AppNote XRD1093: Quantitative analysis of amorphous components in cement by combining the RIR method and the Rietveld method
Quantitative analysis of a 4-component sample AppNote B-XRD1001: quantitative analysis of a 4-component sample
Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector AppNote B-XRD2023: Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector