Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method
AppNote B-XRD3005: Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method
SmartLab
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping
AppNote B-XRD2006: Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping
Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method
AppNote B-XRD2001: Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method
Observation of time-dependent hydration reaction by X-ray diffractometry
AppNote XRD1141: Observation of time-dependent hydration reaction by X-ray diffractometry
Observation of time-dependent hydration reaction by X-ray diffractometry
AppNote XRD1141: Observation of time-dependent hydration reaction by X-ray diffractometry
Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector
AppNote B-XRD2023: Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector
Crystal defect analysis of a single crystal substrate by X-ray reflection topography
AppNote B-XRD2022: cCrystal defect analysis of a single crystal substrate by X-ray reflection topography
Calculation of molecular stacking spacing of copper phthalocyanine using PDF analysis
AppNote XRD1139: Calculation of molecular stacking spacing of copper phthalocyanine using PDF analysis
Rietveld analysis of battery material using a Mo source
AppNote XRD1080: Rietveld analysis of battery material using a Mo source