Advanced semiquant analysis by 'SQX Scatter FP' method AppNote XRF1036: semiquant analysis by 'SQX Scatter FP' method
Fused bead analysis for various oxide materials AppNote XRF1048: fused bead analysis for various oxide materials
Thickness and composition of ITO thin film by FP method AppNote XRF1063: thickness/composition of ITO thin film by FP method
Mapping and small spot analysis with a general purpose WDXRF AppNote XRF1084: mapping / small spot analysis by WDXRF