High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.
Trace elemental surface contamination metrology by TXRF; up to 300 mm wafers