High-resolution benchtop microtomography of large samples
Compact 2D X-ray camera with micron and sub-micron resolution for imaging
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Process sulfur analysis by X-ray transmission (X-ray absorption)
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.