Elements, phases and particle sizes to molecular structure
For all tasks in polymer research, product development, and production quality control, X-ray fluorescence (XRF) analysis can identify and quantify the concentrations of additives (pigments, fillers, flame retardants, stabilizers) like antimony, barium, bromium, calcium, chromium (for the RoHS/WEEE regulations), copper, phosphorus, titanium or zinc.
In addition, many plastic polymers have some order and can be identified and studied by X-ray diffraction (XRD) methods. These polymers are, at least in part, crystalline or pseudo-crystalline with partially ordered structures which cause diffraction peaks. The percent crystallinity is often related to processing methods and is of great importance in polymer chemistry. Other uses of XRD in plastics and polymers research and production include: determination of unit cell type and lattice parameters, determination of the microstructure, and determination of crystallographic orientation through pole figures.
Polymers can also be investigated by small angle X-ray scattering (SAXS). Either dissolved or as a solid, the SAXS technique can characterize polymers according to large-scale internal structure. Rigaku technology and expertise are combined to provide a number of X-ray analytical products for these applications.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
A modernized 2D Kratky system that eliminates data corrections required of traditional systems