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Food and Food Ingredients

Food and food ingredients

Safety, efficacy and content labeling are key requirements in the food industry. At-line or near-line monitoring of production processes improve cost savings by decreasing waste, rework and materials costs. The US FDA, the European Union and various other entities around the world strictly regulate the allowable concentrations of heavy metals in food, drugs and other products and packaging; for example, the over-the counter (OTC) pharmaceutical regulations for cosmetics in the U.S. Rigaku supplies a wide range of dedicated X-ray Fluorescence (XRF) instruments for elemental analysis and X-ray Diffraction (XRD) instruments for phase and structural analysis for both R&D and production applications. Rigaku’s Small Angle X-ray Scattering (SAXS) instruments are the perfect solution for particle size analysis of optically opaque formulations.

Rigaku recommends the following systems:


WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

EDXRF

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples

Process

Scanning multi-element process coatings analyzers for web or coil applications

Applications

The following applications are relevant to this industry

XRD

EDXRF

Process

Total reflection XRF (TXRF)