Phase, elemental and chemical analysis
In studying planetary processes and makeup of the Earth, geologists routinely analyze the composition and molecular structure of rock and mineral samples. Long having been central tools in geological research, X-ray analytical techniques have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. The latest generation of wavelength dispersive XRF instrumentation employs a small analyzing area and an XY-stage to automatically make multiple measurements of a sample to produce a chemical composition map. X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. Rigaku technology and expertise provide a number of unique solutions for these determinations.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Our most popular diffractometer for Chemical Crystallography and Mineralogy, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
A benchtop single crystal X-ray diffractometer ideal for chemical crystallography and teaching.
An entry-level single crystal X-ray diffractometer for Chemical Crystallography configured with microfocus sealed tube technology and a direct X-ray detection detector.
Our most popular diffractometer for Protein Crystallography, configured with a high-flux rotating anode X-ray source and an extremely low noise direct X-ray detection detector.
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
User-inspired data collection and data processing software for small molecule and protein crystallography.
The smallest detachable motorized goniometer head on the market.
Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers.
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
High-resolution benchtop microtomography of large samples