A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analysis of a platinum nanoparticulate film
Characterization of an InN epitaxial film on a sapphire substrate by X-ray reciprocal space mapping (RSM) and rocking curve (RC) analysis
Evaluation of a low dielectric constant (Low-k) insulation thin film between layers using grazing incidence X-ray scattering
Evaluation of molecular orientation of Cu phthalocyanine thin film on rubbing-processed glass substrates
Evaluation of the crystallinity (tilt and twist distributions) of a GaN thin film by the X-ray rocking curve method
Evaluation of the effects of shot-peening treatment on the surface of a spring by X-ray stress measurement
Grazing incident X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) studies of a Ni-Mn-Ga material
Grazing-incidence small angle X-ray scattering (GISAXS) analysis of pore size distributions in nano-porous silica films
TOPIQ | High-pressure Crystallography on the Rigaku XtaLAB Synergy-S Diffractometer Friday, March 22, 2024 - 09:00 CDT Laure Vendier, PhD, LCC CEMES Toulouse Register
Non-destructive inspection of batteries using X-ray Computed Tomography Wednesday, August 21, 2024 - 13:00 CDT Angela Criswell | Co-Presenter: Tim Bradow Register now
Non-destructive Elemental Analysis of Batteries Using XRF Wednesday, June 19, 2024 - 13:00 CDT Amber Quevy | Co-Presenter: Tim Bradow Register now