A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analysis of a platinum nanoparticulate film
Characterization of an InN epitaxial film on a sapphire substrate by X-ray reciprocal space mapping (RSM) and rocking curve (RC) analysis
Evaluation of a low dielectric constant (Low-k) insulation thin film between layers using grazing incidence X-ray scattering
Evaluation of molecular orientation of Cu phthalocyanine thin film on rubbing-processed glass substrates
Evaluation of the crystallinity (tilt and twist distributions) of a GaN thin film by the X-ray rocking curve method
Evaluation of the effects of shot-peening treatment on the surface of a spring by X-ray stress measurement
Grazing incident X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) studies of a Ni-Mn-Ga material
Grazing-incidence small angle X-ray scattering (GISAXS) analysis of pore size distributions in nano-porous silica films
